Navigation

Produktentwicklung Integrierter Systeme (Analog/Mixed-Signal)

Dozent/in

Details

Zeit/Ort n.V.:

  • Fr 10:15-11:45, Raum EL 4.14

Studienfächer / Studienrichtungen

  • WF ME-BA ab Sem. 5
  • WF EEI-BA-MIK ab Sem. 5
  • WF EEI-MA ab Sem. 1
  • WF ICT-MA ab Sem. 1
  • WF ME-MA ab Sem. 1

Inhalt

  • Why analog?

  • Introduction: Development Flow of an IC

  • Quality Control Environments

  • ATE Architecture

  • Analog Instruments

  • Basic Analog Measurement and Test Concepts (DC)

  • DAC testing

  • Data Analysis and Statistics

  • Sampling Theory and DSP-based Testing

  • ADC Testing

  • Design for Test

  • Typical Analog Issues / Pitfalls

  • RF Testing

  • Qualification of ICs

  • Failure Analysis of ICs


Zusätzliche Informationen

Erwartete Teilnehmerzahl: 20