Index

Produktentwicklung Integrierter Systeme (Analog/Mixed-Signal)

Dozent/in

Details

Zeit/Ort n.V.

Inhalt

- Why analog? - Introduction: Development Flow of an IC - Quality Control Environments - ATE Architecture - Analog Instruments - Basic Analog Measurement and Test Concepts (DC) - DAC testing - Data Analysis and Statistics - Sampling Theory and DSP-based Testing - ADC Testing - Design for Test - Typical Analog Issues / Pitfalls - RF Testing - Qualification of ICs - Failure Analysis of ICs

Zusätzliche Informationen

Erwartete Teilnehmerzahl: 40

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